XPS – X-Ray Photoelectron Spectroscopy is a surface sensitive tool which provides both elemental compositions, as well as chemical bonding information. It is sensitive to all elements (Z number greater than hydrogen) and is a good measure of oxidation, as well as inorganic residues at 0.5 atom % or greater. Based on the shape of the carbon C (1s) peak, the degree of graphitic character can be inferred.
